By Donald E. Leyden (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Donald E. Leyden, John C. Russ, Paul K. Predecki (eds.)
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Extra resources for Advances in X-Ray Analysis: Volume 30
Nichols & Dale R. Boehme Sandia National Laboratory Livermore, California Richard lI. Ryon Lawrence Livermore National Laboratory Livermore, California David lIherry, Brian Cross &Gary Aden Kevex Corporation Foster City, California ABSTRACT X-ray Microfluorescence (XRMF) analysis uses a finely collimated beam of X-rays to excite fluorescent radiation in a sample (Nichols & Ryon 1986). Characteristic fluorescent radiation emanating from the small interaction volume element is acquired using an energy dispersive detector placed in close proximity to the sample.
1, a typical example of carbon analysis in cast iron is shown. 3 ADsorption correction term of silicon and overlapping correction term of molybdenum are shown in the calibration curve. 16 I. 6 X-Roy Analysis Committee 119771 (30 Lab.! 3 4 300 20 10 5 5 10 10 5 10 10 22 30 10 10 20 20 300 5 5 2 2 4 9 2 3 2 9 7 3 4 7 5 9 2 5 12 8 2 15 :.... tmWm I II 15;e11 In1erelement Effect r app ng Intensity-Concentltltion Curve of Binary Component BInary Alloy Nlln Fe Fe In Cr Figure 2 - Mathematical Calculation for Matrix Correction in X-ray Fluorescent Analysis In XRF, matrix correction technique is most important, and the X-ray subcommittee for iron and steel developed a correction method ("d" method) which is shown in Fig.
The present study of parameters affecting the performance of an X-ray microfluorescence system has shown how such systems use X-ray beams with effective spot sizes less than 100 micrometers to bridge the gap in analytical capabilities between predominately surface micro analytical techniques such as SEM/EDX and bulk analytical methods such as standard XRF analysis. The combination of XRMF spectroscopy with digital imaging allows chemical information to be obtained and mapped from surface layers as well as from layers or structures beneath the sample surface.