New Horizons of Applied Scanning Electron Microscopy by Kenichi Shimizu, Tomoaki Mitani

By Kenichi Shimizu, Tomoaki Mitani

In sleek scanning electron microscopy, pattern floor guidance is of key value, simply because it is in transmission electron microscopy. With the methods for pattern floor instruction supplied within the current booklet, the large strength of complicated scanning electron microscopes might be discovered totally. this can take the reader to a completely new point of scanning electron microscopy and finely-detailed photos by no means visible before.

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The quality of the image presented in Fig. 1 is comparable to, or even better than, that reported for a similar film where ultramicrotomed sections, ∼20 nm thick, were examined by TEM/EELS imaging [16]. Further, it is emphasized that the image in Fig. 1 was obtained readily and quickly, in less than 1 h, including sample surface preparation. 40 Application Example 13: Cross-Sectional Examination of Al − Fe Alloy Fig. 1. Cross-section of a porous anodic oxide film grown on an Al − Fe alloy examined in the high-angle BSE imaging mode Application Example 14: Corrosion of an Al 2024-T3 Alloy for Aerospace Application In corrosion studies, SEMs have been widely used for the examination of sample surfaces after various corrosion tests.

With the cross-section of galvanized steel, prepared in the manner described above, the Zn/steel interface has been observed clearly in the highangle BSE imaging mode (Fig. 1). Over the steel substrate, a zinc layer, ∼20 μm thick, is observed; lamellar or colony structures, characteristic for eutectic zinc, are observed clearly through Z-contrast. In the zinc matrix, which exhibits a lighter contrast, sub-grains are also revealed by the channeling contrast (Fig. 1a). It is emphasized here that the area suitable for examination extends ∼2 mm along the interface.

2). Otherwise, or at acceleration voltages higher than 1 kV, 18 Application Example 5: Thin Layer of Organic Contaminant on the Surface Fig. 1. Thin contaminant layers over the surface of a mirror-polished, Ni-Pcoated hard disk substrate revealed by in-lens SE and high-angle BSE imaging the electron beam shoots down the contaminant layer and the layers can never be disclosed. Over the surface of mirror-polished Ni-P surface, darker spots of diameters up to ∼2 μm are revealed, though still only faintly, by in-lens SE imaging at, for example, the locations indicated by the arrows.

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